A Nu approach to AFM probes
SCOUT Probes
- AC/non-contact probes, key features:
- Every probe inspected, guarantees tip sharpness & reliable imaging.
- Conical tips reduce imaging artifacts.
- Consistent mechanical properties in every pack.
- Key parameters:
- SCOUT 350 – 350 kHz 42 N/m
- SCOUT 150 – 150 kHz 18 N/m
- SCOUT 70 – 70 kHz 2 N/m
Tip parameters:
| Parameter | Nominal | Range |
| Radius (nm) | 5 | < 10 |
| Height (µm) | 12 | 10 – 13 |
| Set back (µm) | 7.5 | 6.5 – 8.5 |
| Shape | Conical | |
| Cone Angle (°) | 25 | 15 – 40 |
| Material | Silicon (n-type, Sb) | |
| Resistivity (Ωcm) | 0.02 | 0.015 – 0.025 |
| Coatings | Available with Al, Au or no reflex coating | |
| Typical values, please enquire for a data sheet | ||
SPARK Probes
- Electrical probes, key features:
- Highly tapered profile reduces stray electrical signals.
- Unique coating preserves tip sharpness.
- Consistent mechanical properties in every pack.
- Key parameters:
- SPARK 350 – 350 kHz 42 N/m
- SPARK 150 – 150 kHz 18 N/m
- SPARK 70 – 70 kHz 2 N/m
Tip parameters:
| Parameter | Nominal | Range |
| Radius (nm) | 18 | < 30 |
| Height (µm) | 12 | 10 – 13 |
| Set back (µm) | 7.5 | 6.5 – 8.5 |
| Shape | Conical | |
| Cone Angle (°) | 25 | 15 – 40 |
| Material | Silicon (n-type, Antimony) | |
| Resistivity (Ωcm) | 0.02 | 0.015 – 0.025 |
| Coatings | Frontside/Tip: 5nm Ti / 40nm Pl Backside/Reflective 5nm Ti / 40nm Pt |
|
| Typical values, please enquire for a data sheet | ||
Looking for AFM systems?
We offer AFMWorkshop systems. Intuitive, robust, and affordable with open architecture designed for research and teaching labs.
