Products
Systems
Atomic force microscopy
- Robust and reliable AFM
- Affordable for all budgets
- Intuitive for easy use
- Ideal for teaching and training
- Perfect for routine and innovative research
Mass Spectrometers
- High-performance mass spectrometers
- MALDI-TOF, SIMS, GC-ToFMS
- Entry-level to flagship research platforms
- Fully custom configurations available
- Surface analysis, imaging, and molecular identification
Deposition systems
- Magnetron sputtering
- E-beam evaporation
- Nanoparticle deposition
- Optionally fully UHV (250°C)
- Ideal for cross-functional shared labs
Components
E-beam and sputtering
- Neutral atom source
- For use with oxygen, nitrogen, hydrogen or argon gases
- Nanoparticle source
- Triple sputter
- 4-pocket E-beam – single power supply
HV & UHV connectivity
- Sub-D in-vacuum connectors and cabling
- Coaxial cables: BNC, N50, SMA, SMB, SMP and more
- Kapton cables
- Pressure burst discs for vacuum safety
- Bespoke engineering
Superconducting qubits
- Ideal for evaluation and testing
- System design and cryostat testing
- User-friendly (SMPM)
- With Au-coated OFC packaging
- Optional individual T1 characterization
Accessories
AFM probes
- SCOUT probes for imaging (42, 18, & 2 N/m)
- SPARK, Pt-coated for electrical modes
- Reproducible and highly reliable performance
- Conical tip for simplified deconvolution
- Ideal for high-precision imaging and measurements
SERS substrates
- Surface-enhanced Raman scattering (SERS) sample slides
- Ag or Au nanoparticle coating for enhanced signal
- High surface/volume ratio for maximum enhancement
- Ideal for sensitive measurements (e.g., drug testing)
Calibration sample for SKPM
- Structured sample for work function calibration
- Standard with 3 metals for versatile use
- Easy to connect for quick setup
- Developed in collaboration with the Danish Institute of Metrology
- Ideal for accurate work function measurements