Atomic force microscopy for research, industry, and education

Intuitive, robust, and affordable the AFMWorkshop AFM's eliminate the complexities that make starting an AFM project so challenging. A common platform reduces costs, while the open architecture makes them future-proof and ideal for both learners and innovators testing new ideas.

B-3

AFM for Teaching & Training

Starting from € 31,800
(excl. VAT, shipping)
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The B3 is a fully configured sample-scanning AFM with strain-gauge linearized piezo scanners and a universal probe holder compatible with all AFM probes. The 5MP 200x video camera guides you to your region-of-interest, while the acoustic hood maintains a low-noise environment while your AFM works for you.

The B3 is supported with online tutorials and a full teaching module in our learning centre. It ‘s ideal for training students on Atomic Force Microscope principles and introducing them directly to the Nanoverse!

Key Specifications

Sample Sizes:25 mm x 25 mm x 12 mm
Standard Scanning Modes:AC/tapping, Phase, Contact, LFM, Force Distance
Scanner:50 micron x 50 micron x 17 micron scanner
Video Optical Microscope:5 MP Video Camera, 200 X

TT-2

Modular Table-Top AFM – Industry Standard

Starting from € 35,000
(excl. VAT, shipping)

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The TT-2 is a modular, open-architecture table-top sample-scanning AFM for routine nanoscale imaging and surface analysis. With <80pm noise floor, it can measure from nanometers to microns. Tip approach is tilt-free, and the region of interest is easily selected with the video microscope. LabView-based software is familiar and easy-to-use for regular users, while allowing expandability for innovators.

Over 200 systems installed worldwide – recognized as THE robust, affordable and intuitive AFM.

Key Specifications

Sample Sizes:Up to 25 mm x 25 mm x 17 mm”
Standard Scanning Modes:AC/Tapping, Phase, Contact, LFM, F/D
Scanners:100 X 100 X 17 µm, 50 X 50 X17 µm, 15 X 15 X 7 µm, to be selected
Video Optical Microscope:Zoom to 400X, 2 µm resolution
Stage and controller:Compact table top design

Available Options Section

Available Options

Dunk and Scan Probe Holder
Open liquid cell for scanning samples submerged in liquids.
Environmental Cell
Permits scanning in inert environments or liquids.
Conductive AFM
Measures the 2D conductivity of sample surfaces.
Electric Force Microscope
Using two pass scanning, the electric charge at a surface is imaged.
Scanning Kelvin Probe Microscopy
SKPM measures the potential difference between a conductive probe and a conductive sample.
Magnetic Force Microscopy
Measures the surface magnetic field using a magnetic probe into the AFM.
Scanning Tunneling Microscope
Tunnelling current between the probe and sample is used as feedback, for electrically conductive samples.
Lithography
Uses an AFM probe to alter the physical or chemical property of a sample surface.
Advanced Force/Distance Curves
Measures the deflection of a cantilever as it interacts with a surface. Monitors parameters: Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness.
Focus Assist
Motorized focus for precise control during probe approach.
Breakout Box
BNC access to most Ebox signals.
Image Logger
Allows display of six channels in the forward and reverse direction. Includes a spectrum function as well as a twelve channel data logger.
Force/Distance Curve Analysis Software
Force/Distance Curves measure the deflection of a cantilever as it interacts with a surface.
Q box/Q Base
Unique vibration solution reducing sound and structural vibrations.
Document Package
Complete mechanical drawings, electronic schematics, and software protocols.
AFM Laboratory Curriculum
All-inclusive undergraduate curriculum for atomic force microscopy, including a Student Manual, Teacher Manual, four samples, and eight probes.

HR

High-Resolution Compact AFM

Starting from € 42,100
(excl. VAT, shipping)

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The HR AFM is a robust, compact high-resolution AFM with an exceptional noise floor of only 35 pm (15 micron scanner, with suitable vibration isolation). It offers optional motorized sample positioning and focus assist, plus a cell for in-liquid imaging.

Key Specifications

Sample Sizes:Up to 25 mm x 25 mm x 12 mm
Standard Scanning Modes:AC/Tapping, Phase, Contact, LFM, F/D
Scanners:100 X 100 X 17 µm, 50 X 50 X17 µm, 15 X 15 X 7 µm, to be selected
Video Optical Microscope:Top View: 400 X Research Grade, Side View: 200 X Cell Phone Type
Stage and Controller Size:Compact table top design

Available Options Section

Available Options

Motorized Controls
Automate several functions of the HR AFM - direct drive, focus assist and motorized stage.
Conductive AFM
Measures the 2D conductivity maps of sample surfaces.
Electric Force Microscope
Using two pass scanning, the electric charge at a surface is imaged.
Scanning Kelvin Probe Microscopy
SKPM measures the potential difference between a conductive probe and a conductive sample.
Magnetic Force Microscopy
Measures the surface magnetic field using a magnetic probe into the AFM.
Scanning Tunneling Microscope
Tunnelling current between the probe and sample is used as feedback, for electrically conductive samples.
Lithography
Uses an AFM probe to alter the physical or chemical property of a sample surface.
Advanced Force/Distance Curves
Measures the deflection of a cantilever as it interacts with a surface. Monitors parameters: Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness. Advanced SPIP analysis software.
Image Logger
Allows display of six channels in the forward and reverse direction. Includes a spectrum function as well as a twelve channel data logger.
Dunk and Scan Probe Holder
Open liquid cell for scanning samples submerged in liquids. Can directly replace the HR AFM probe holder.

HR-2D

Specialized for 2D & Low-Dimensional Materials

Starting from € 35,490
(excl. VAT, shipping)

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The HR-2D is designed specifically for 2D and low-dimensional materials, offering <30pm noise floor (17 micron scanner, with suitable vibration isolation). Powerful, affordable and robust, this AFM has a small footprint (180 × 180 mm) and is easily accommodated in a glove box.

Key Specifications

Sample Sizes:Up to 25 mm x 25 mm x 12 mm
Standard Scanning Modes:AC/Tapping, Phase, Contact, LFM, F/D
Scanners:100 X 100 X 17 µm, 50 X 50 X17 µm, 15 X 15 X 7 µm, to be selected
Video Optical Microscope:Top View: 5MP Camera, FOV 1 X 1 mm, Resolution: 2 micron
Stage and Controller Size:180 mm x 180 mm x 280 mm

Available Options Section

Available Options

Dunk and Scan Probe Holder
Open liquid cell for scanning samples submerged in liquids. Can directly replace the HR-2D AFM probe holder.
Conductive AFM
Measures the 2D conductivity maps of sample surfaces.
Electric Force Microscope
Using two pass scanning, the electric charge at a surface is imaged.
Scanning Kelvin Probe Microscopy
SKPM measures the potential difference between a conductive probe and a conductive sample.
Magnetic Force Microscopy
Measures the surface magnetic field using a magnetic probe into the AFM.
Scanning Tunneling Microscope
Tunnelling current between the probe and sample is used as feedback, for electrically conductive samples.
Lithography
Uses an AFM probe to alter the physical or chemical property of a sample surface.
Advanced Force/Distance Curves
Measures the deflection of a cantilever as it interacts with a surface. Monitors parameters: Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness. Advanced SPIP analysis software.
Breakout Box
BNC access to most Ebox signals.
Image Logger
Allows display of six channels in the forward and reverse direction. Includes a spectrum function as well as a twelve channel data logger.

SA

Stand-Alone Tip-Scanning AFM

Starting from € 43,100
(excl. VAT, shipping)

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Ideal for non-standard and unusual sample shapes and sizes, the Stand-Alone AFM is an open-framed, tip-scanning AFM that can be placed on practically any surface. Either measure your sample on our optional small sample positioning stage, or place the AFM directly on the device you wish to measure. The AFM Probe extends below the AFM stage, accessing your sample, whatever size it may have.

Key Specifications

Open Frame Design:Any sized sample can be scanned
Includes removable bottom plate with XY translator:Allows for scanning small samples
Standard Scanning Modes:AC/Tapping, Phase, Contact, LFM, F/D
X/Y Scanner: 50 X 50 µm
Z Scanner:17 µm or 7 µm, to be selected
Top View Video Microscope:Facilitates tip approach and laser alignment
Stage and Controller Size:Compact design

Available Options Section

Available Options

Dunk and Scan Probe Holder
Open liquid cell for scanning samples submerged in liquids,for small samples.
Conductive AFM
Measures the 2D conductivity maps of sample surfaces.
Electric Force Microscope
Using two pass scanning, the electric charge at a surface is imaged.
Scanning Kelvin Probe Microscopy
SKPM measures the potential difference between a conductive probe and a conductive sample.
Magnetic Force Microscopy
Measures the surface magnetic field of a sample by incorporating a magnetic probe into the AFM.
Scanning Tunneling Microscope
Tunnelling current between the probe and sample is used as feedback, for electrically conductive samples.
Lithography
Uses an AFM probe to alter the physical or chemical property of a sample surface.
Advanced Force/Distance Curves
Measures the deflection of a cantilever as it interacts with a surface. Monitors parameters: Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness. Advanced SPIP analysis software.
Breakout Box
BNC access to most Ebox signals.
Image Logger
Allows display of six channels in the forward and reverse direction. Includes a spectrum function as well as a twelve channel data logger.

Starting from € 35,490
(excl. VAT, shipping)

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