PRODUCTS
Systems
Deposition Systems
Magnetron Sputtering
E-Beam Evaporation
Nanoparticle Deposition
Optionally fully UHV (250°C)
- Ideal for Cross-Functional Shared Labs
Atomic Force Microscopy
- Robust & Reliable AFM
- Affordable for All Budgets
- Intuitive for Easy Use
- Ideal for Teaching & Training
- Perfect for Routine & Innovative Research
Superconducting Qubits
- Ideal for Evaluation & Testing
- System Design, & Cryostat Testing
- User-Friendly (SMPM)
- With Au-Coated OFC Packaging
- Optional Individual T1 Characterization
Components
E-beam and Sputtering
Neutral Atom Source
For use with Oxygen, Nitrogen, Hydrogen or Argon gases.
Nanoparticle Source
Triple Sputter
4-Pocket E-Beam – Single Power Supply
HV & UHV connectivity
- Sub-D In-Vacuum Connectors & Cabling
- Coaxial Cables: BNC, N50, SMA, SMB, SMP and more
- Kapton Cables
- Pressure Burst Discs for Vacuum Safety
- Bespoke Engineering
NV Diamonds Quantum Sensors
- PillarBright NV Array in Engineered Diamond
- Well-Defined Test Structure Array
- Ideal for NV Experiment Setup
- Light-Guiding Diamond Structures for Enhanced Performance
- Up to 3x PL Signal Gain
Accessories
AFM Probes
SCOUT Probes for Imaging (45, 18, & 2 N/m)
SPARK, Pt-Coated for Electrical Modes
Reproducible & Highly Reliable Performance
Conical Tip for Simplified Deconvolution
Ideal for High-Precision Imaging and Measurements
SERS Substrates
- Surface-Enhanced Raman Scattering (SERS) Sample Slides
- Ag or Au Nanoparticle Coating for Enhanced Signal
- High Surface/Volume Ratio for Maximum Enhancement
- Ideal for Sensitive Measurements (e.g., Drug Testing)
Calibration sample for SKPM
- Structured Sample for Work Function Calibration
- Standard with 3 Metals for Versatile Use
- Easy to Connect for Quick Setup
- Developed in Collaboration with the Danish Institute of Metrology
- Ideal for Accurate Work Function Measurements