Secondary ion mass spectrometry (SIMS)
Secondary ion mass spectrometry (SIMS) is the technique of choice for elemental and molecular characterisation of solid surfaces, thin films, and interfaces. SAI’s MiniSIMS and MidiSIMS families scale SIMS capability from desktop systems for routine QA through to high-resolution research platforms capable of sub-micron spatial imaging , all supporting static, dynamic, and imaging SIMS modes.
MiniSIMS Alpha
Entry-level desktop SIMS
Routine surface analysis
An entry-level desktop system combining a liquid metal ion source (LMIS) with a quadrupole mass analyser. All three SIMS modes at a per-sample cost suited to industrial QA and routine monitoring workflows.
Key Capabilities
| Liquid metal ion source with quadrupole mass analyser |
| Static, dynamic, and imaging SIMS modes |
| Desktop form factor with minimal infrastructure requirements |
| Cost-effective per-sample analysis for routine monitoring |
MiniSIMS-ToF
Time-of-flight SIMSR&D and failure analysis
Replaces the quadrupole of the Alpha with a time-of-flight analyser, extending mass range, mass resolution, and acquisition efficiency. The defining advantage is retrospective analysis , the full mass spectrum is captured at every pixel, so datasets can be re-interrogated after acquisition without pre-selecting target masses.
Key Specifications
| Time-of-flight analyser for full parallel spectral acquisition |
| Extended mass range and improved mass resolution compared to quadrupole SIMS |
| Complete retrospective analysis of imaging and depth-profiling data |
| No prior knowledge of sample composition required |
MidiSIMS-ToF-HR
High-resolution SIMSAdvanced imaging
Designed for applications requiring sub-micron spatial resolution and high throughput. Active anti-vibration isolation and high-resolution DC primary ion guns deliver superior imaging resolution at much higher duty cycles than conventional pulsed-primary systems, with a choice of primary ion species for sample-specific optimisation.
Key Specifications
| Sub-micron spatial resolution via high-resolution DC primary ion guns |
| Active anti-vibration isolation for stable high-resolution imaging |
| Choice of primary ion species for sample-specific optimisation |
| High duty cycle enabling faster imaging vs. pulsed-primary systems |